News

2017.10.05

NANO Testing Symposium 2017

This event has ended. TOOL Corp. is exhibiting its LAVIS-plus, an IC design visualization system, at The 37th   [more…]

2017.08.09

SupportWeb Renovation (for Japanese site only)

This news is available in Japanese only.

2017.07.27

SupportWeb System Maintenance Notice (for Japanese site only)

This news is available in Japanese only.

2017.07.10

Development Service page has been added

This service is available only for domestic customers.

2017.03.02

Photomask Japan 2017

This event has ended. We are exhibiting at Photomask Japan 2017. Please visit our booth to learn more about ou  [more…]

2016.12.27

Business Hours during the Year-end and New Year holidays

Dear Customers, Our office will be closed for the Year-end and New Year holidays from Thursday, December 29, 2  [more…]

2016.11.01

The 36th Annual Nano Testing Symposium

This event has ended. TOOL Corp. is exhibiting its LAVIS-plus, an IC design visualization system, at The 36th   [more…]

2016.10.03

CSIA-ICCAD 2016 Annual Conference & Changsha IC Industry Innovation and Development Summit

This event has ended. We are exhibiting our LAVIS-plus, RSCALC and OASIS-Utility at CSIA-ICCAD 2016 Annual Con  [more…]

2016.05.23

Design Automation Conference 2016

This event has ended. We are exhibiting our LAVIS-plus, RSCALC and OASIS-Utility at Design Automation Conferen  [more…]

2016.02.22

Photomask Japan 2016

This event has ended. We are exhibiting our MaskStudio and OASIS-Utility at Photomask Japan 2016. Please visit  [more…]