{"id":3273,"date":"2021-08-20T08:54:20","date_gmt":"2021-08-19T23:54:20","guid":{"rendered":"https:\/\/www.tool.co.jp\/?page_id=3273"},"modified":"2021-10-04T16:51:24","modified_gmt":"2021-10-04T07:51:24","slug":"hifs","status":"publish","type":"page","link":"https:\/\/www.tool.co.jp\/en\/products\/lavis-plus\/hifs\/","title":{"rendered":"HAMAMATSU-IF Suite"},"content":{"rendered":"<p><\/p>\n<h3>Product Overview<\/h3>\n<p><strong>HAMAMATSU-IF Suite <\/strong>consists of\u00a0<strong>HAMAMATSU-IF<\/strong>,\u00a0 a CAD navigation function which links the semiconductor failure analysis system (hereinafter referred to as the System) of Hamamatsu Photonics K.K and <strong>LAVIS-plus<\/strong>, and <strong>EASY-S<\/strong>, a function for static failure analysis.<br \/>\n* To use these functions requires <strong>HAMAMATSU-IF<\/strong> and <strong>EASY-S<\/strong> licenses in addition to LAVIS-plus<br \/>\n&nbsp;&nbsp;&nbsp;and input file licenses.<\/p>\n<p><img loading=\"lazy\" class=\"aligncenter wp-image-3315 size-medium\" src=\"https:\/\/www.tool.co.jp\/wp-content\/uploads\/hif-360x202.png\" alt=\"hif\" width=\"360\" height=\"202\" srcset=\"https:\/\/www.tool.co.jp\/wp-content\/uploads\/hif-360x202.png 360w, https:\/\/www.tool.co.jp\/wp-content\/uploads\/hif.png 475w\" sizes=\"(max-width: 360px) 100vw, 360px\" \/><\/p>\n<h4>HAMAMATSU-IF<\/h4>\n<p>A CAD navigation function which obtains the observed image from the System and overlays it on the layout data displayed on LAVIS-plus. It can be used for various devices including logic device, memory device, power device, and flat panel device.<\/p>\n<ul>\n<li>Available in both online and offline environment<br \/>\n* To use the HAMAMATSU-IF offline, save the observed image with the System in a TIFF format<br \/>\n&nbsp;&nbsp; in advance.<\/li>\n<\/ul>\n<h4>EASY-S<\/h4>\n<p>In addition to functions available with HAMAMATSU-IF, EASY-S offers functions for static failure analysis as follows:<br \/>\nUsing EASY-S for PEM and OBIRCH analyses can efficiently narrow down the nets and cells related to the detected signals. It is especially effective for logic device.<\/p>\n<ul>\n<li>Auto-detects nets and cells related to the detected signal areas such as photo emission and OBIRCH.<\/li>\n<li>Displays the histogram for areas through which nets and cells pass.<\/li>\n<li>Extracts the figures adjacent to nets.<\/li>\n<\/ul>\n<h3>Operating Environment<\/h3>\n<p>Available functions vary depending on the system control software version, and whether HAMAMATSU-IF suite is used online\/offline. For details about the operating environment, supported failure analysis systems, functions, and any other questions, please feel free to contact our sales representative from <a title=\"Contact\" href=\"https:\/\/www.tool.co.jp\/contact\/\">Contact<\/a>.<\/p>","protected":false},"excerpt":{"rendered":"<p>Product Overview HAMAMATSU-IF Suite consists of\u00a0HAMAMATSU-IF,\u00a0 a CAD navigation function which links the semic&nbsp;&nbsp;<a href=\"https:\/\/www.tool.co.jp\/en\/products\/lavis-plus\/hifs\/\" >[more&#8230;]<\/a><\/p>\n","protected":false},"author":2,"featured_media":0,"parent":83,"menu_order":1,"comment_status":"closed","ping_status":"closed","template":"","meta":[],"tags":[],"_links":{"self":[{"href":"https:\/\/www.tool.co.jp\/en\/wp-json\/wp\/v2\/pages\/3273"}],"collection":[{"href":"https:\/\/www.tool.co.jp\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.tool.co.jp\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.tool.co.jp\/en\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.tool.co.jp\/en\/wp-json\/wp\/v2\/comments?post=3273"}],"version-history":[{"count":91,"href":"https:\/\/www.tool.co.jp\/en\/wp-json\/wp\/v2\/pages\/3273\/revisions"}],"predecessor-version":[{"id":3433,"href":"https:\/\/www.tool.co.jp\/en\/wp-json\/wp\/v2\/pages\/3273\/revisions\/3433"}],"up":[{"embeddable":true,"href":"https:\/\/www.tool.co.jp\/en\/wp-json\/wp\/v2\/pages\/83"}],"wp:attachment":[{"href":"https:\/\/www.tool.co.jp\/en\/wp-json\/wp\/v2\/media?parent=3273"}],"wp:term":[{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.tool.co.jp\/en\/wp-json\/wp\/v2\/tags?post=3273"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}